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Pecharsky, Vitalij K.

Fundamentals of powder diffraction and structural characterization of materials / by Vitalij K. Pecharsky, Peter Y. Zavalij. - xxiii, 713 pages : illustrations ; 24 cm. + 1 CD-ROM (4 3/4 inches)

Includes bibliographical references and index.

Contents Preface. 1. Fundamentals of Crystalline State. 2. Fundamentals of Diffraction. 3. Experimental Techniques. 4. Preliminary Data Processing and Phase Analysis. 5. Unit Cell Determination and Refinement. 6. Crystal Structure Determination. 7. Crystal Structure Refinement. Index.

ISBN: 1402073658 (acid-free paper)

Subjects--Topical Terms:
X-rays--Diffraction--Measurement.
Powders--Optical properties--Measurement.
X-ray crystallography.

LC Class. No.: QC482.D5 / P43 2003