Handbook of X-ray spectometry /
Handbook of X-ray spectometry /
edited by René E. Van Grieken, Andrzej A. Markowicz
- 2nd ed., rev. and expanded
- xvi, 983 pages : illustrations ; 26 cm
- Practical spectroscopy ; 29 .
- Practical spectroscopy ; v. 29 .
Includes bibliographical references and index
Contents Preface to the Second Edition Preface to the First Edition Contributors 1 X-ray Physics 2 Wavelength-Dispersive X-ray Fluorescence 3 Energy-Dispersive X-ray Fluorescence Analysis Using X-ray Tube Excitation 4 Spectrum Evaluation 6 Quantification in XRF Analysis of Intermediate-Thickness Samples 7 Radioisotope-Excited X-ray Analysis 8 Synchrotron Radiation-Induced X-ray Emission 9 Total Reflection X-ray Fluorescence 10 Polarized Beam X-ray Fluorescence Analysis 11 Microbeam XRF 12 Particle-Induced X-ray Emission Analysis 13 Electron-Induced X-ray Emission 14 Sample Preparation for X-ray Fluorescence Index /Andrzej A. Markowicz /Jozef A. Helsen, Andrzej Kuczumow /Andrew T. Ellis /Piet Van Espenv5 Quantification of Infinitely Thick Specimens by XRF Analysis /Johan L. de Vries, Bruno A. R. Vrebos /Andrzej A. Markowicz, Rene E. Van Grieken /Stanislaw Piorek /Keith W. Jones /Peter Kregsamer, Christina Streli, Peter Wobrauschek /Joachim Heckel, Richard W. Ryon /Anders Rindby, Koen H. A. Janssens /Willy Maenhaut, Klas G. Malmqvist /John A. Small, Dale E. Newbury, John T. Armstrong /Martina Schmeling, Rene E. Van Grieken
0824706005
2001055348
X-ray spectroscopy.
Spectrometry, X-Ray Emission--methods
QD96.X2 / H35 2002
Includes bibliographical references and index
Contents Preface to the Second Edition Preface to the First Edition Contributors 1 X-ray Physics 2 Wavelength-Dispersive X-ray Fluorescence 3 Energy-Dispersive X-ray Fluorescence Analysis Using X-ray Tube Excitation 4 Spectrum Evaluation 6 Quantification in XRF Analysis of Intermediate-Thickness Samples 7 Radioisotope-Excited X-ray Analysis 8 Synchrotron Radiation-Induced X-ray Emission 9 Total Reflection X-ray Fluorescence 10 Polarized Beam X-ray Fluorescence Analysis 11 Microbeam XRF 12 Particle-Induced X-ray Emission Analysis 13 Electron-Induced X-ray Emission 14 Sample Preparation for X-ray Fluorescence Index /Andrzej A. Markowicz /Jozef A. Helsen, Andrzej Kuczumow /Andrew T. Ellis /Piet Van Espenv5 Quantification of Infinitely Thick Specimens by XRF Analysis /Johan L. de Vries, Bruno A. R. Vrebos /Andrzej A. Markowicz, Rene E. Van Grieken /Stanislaw Piorek /Keith W. Jones /Peter Kregsamer, Christina Streli, Peter Wobrauschek /Joachim Heckel, Richard W. Ryon /Anders Rindby, Koen H. A. Janssens /Willy Maenhaut, Klas G. Malmqvist /John A. Small, Dale E. Newbury, John T. Armstrong /Martina Schmeling, Rene E. Van Grieken
0824706005
2001055348
X-ray spectroscopy.
Spectrometry, X-Ray Emission--methods
QD96.X2 / H35 2002
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