MARC ayrıntıları
| 000 -LEADER |
|---|
| fixed length control field |
01673nam a2200325 i 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
050803s2006 gw a 000 0 eng d |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
2005931757 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
3540279857 |
| Qualifying information |
hbk. |
| 024 3# - OTHER STANDARD IDENTIFIER |
|---|
| Standard number or code |
9783540279860 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(OCoLC)ocm62554168 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
OHX |
| Transcribing agency |
OHX |
| Modifying agency |
BAKER |
| -- |
UAT |
| -- |
IXA |
| -- |
DLC |
| -- |
BAUN |
| 049 ## - LOCAL HOLDINGS (OCLC) |
|---|
| Holding library |
BAUN_MERKEZ |
| 050 04 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
QD945 |
| Item number |
.W55 2006 |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Edition number |
22 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Will, Georg. |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Powder diffraction : |
| Remainder of title |
the Rietveld method and the two-stage method to determine and refine crystal structures from powder diffraction data / |
| Statement of responsibility, etc |
Georg Will. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
Berlin ; |
| -- |
New York : |
| Name of producer, publisher, distributor, manufacturer |
Springer, |
| Date of production, publication, distribution, manufacture, or copyright notice |
[2006] |
|
|---|
| Date of production, publication, distribution, manufacture, or copyright notice |
©2006 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
ix, 224 pages : |
| Other physical details |
illustrations ; |
| Dimensions |
25 cm. |
| 336 ## - CONTENT TYPE |
|---|
| Content Type Term |
text |
| Content Type Code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
|---|
| Media Type Term |
unmediated |
| Media Type Code |
unmediated |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
|---|
| Carrier Type Term |
volume |
| Carrier Type Code |
volume |
| Source |
rdacarrier |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc |
Includes bibliographical references (pages [195]-202) and index. |
| 505 00 - FORMATTED CONTENTS NOTE |
|---|
| Title |
Contents |
| -- |
1 General considerations 1 |
| -- |
Introduction 1 |
| -- |
Powder diffraction 9 |
| -- |
2 The Rietveld method 41 |
| -- |
The Rietveld method 41 |
| -- |
Special applications of the Rietveld method 64 |
| -- |
3 The two stage method 73 |
| -- |
Introduction and background 73 |
| -- |
Profile analysis and profile fitting 77 |
| -- |
Examples of profile fitting in the two stage method 95 |
| -- |
POWLS 99 |
| -- |
Specimen and preferred orientation 107 |
| -- |
R-values 112 |
| -- |
Structure refinement by the two stage method 125 |
| -- |
Analysis of quartz 136 |
| -- |
Texture analysis with the two stage method using neutron diffraction 147 |
| -- |
Selected examples for the application of the two stage method 160 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Rietveld method. |
|
|---|
| Topical term or geographic name as entry element |
X-rays |
| General subdivision |
Diffraction. |
| 900 ## - EQUIVALENCE OR CROSS-REFERENCE-PERSONAL NAME [LOCAL, CANADA] |
|---|
| Personal Name |
19549 |
|
|---|
| Numeration |
Satın |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Library of Congress Classification |
| Koha item type |
Kitap |
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