Bowen, D. Keith (David Keith), 1940- (Personal Name)

Z-ray imaging II, 1986: t.p. (D. Keith Bowen) p. v (University of Warwick)

X-ray imaging II, c1986: t.p. (D. Keith Bowen) p. v (Univ. of Warwick, U.K.)

X-ray metrology in semiconductor manufacturing, 2005: CIP t.p. (David K. Bowen)

LC data base, 5/2/87 (hdg.: Bowen, David Keith, 1940- ; usage: D. Keith Bowen, D.K. Bowen)