The Rietveld method/ edited by R.A. Young.

Includes bibliographical references and index.

Introduction to the Rietveld Method 1. The early days: a retrospective view 2. Mathematical aspects of Rietveld refinement 3. The flow of radiation in a polycrystalline material 4. Data collection strategies: fitting the experiment to the need 5. Background modelling in Rietveld analysis 6. Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis 7. Crystal imperfection broadening and peak shape in the Rietveld method 8. Bragg reflection profile shape in X-ray powder diffraction patterns 9. Restraints and constraints in Rietveld refinement 10. Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources 11. Combined X-ray and neutron Rietveld refinement 12. Rietveld analysis programs Rietan and Premos and special applications 13. Position - constrained and unconstrained powder-pattern-decomposition methods 14. Ab initio structure solutions with powder diffraction data

"This book is distinctly not a 'proceedings' but it is a product of the same thrust that was responsible for the International Workshop on the Rietveld Method hosted by the Netherlands Energy Research Foundation ECN in Petten, The Netherlands, 13-15 June 1989. The workshop was organized by the IUCr Commission on Powder Diffraction (CPD) in co-operation with the ECN and was sponsored by the International Union of Crystallography (IUCr)." "Oxford science publications."