Manufacturing engineering and technology / Serope Kalpakjian, Steven R. Schmid, Hamidon Musa.
Yayıncı: Singapore : Prentice Hall, [2010]Telif hakkı tarihi:©2010Baskı: Sixth edition in sı unitsTanım: xx, 1148 pages : illustrations ; 26 cmİçerik türü:- text
- unmediated
- volume
- 9789810681449
- TS176 .K34 2010
| Materyal türü | Ana kütüphane | Koleksiyon | Yer numarası | Durum | İade tarihi | Barkod | Materyal Ayırtmaları | |
|---|---|---|---|---|---|---|---|---|
Kitap
|
Mehmet Akif Ersoy Merkez Kütüphanesi Genel Koleksiyon | Non-fiction | TS176 .K34 2010 (Rafa gözat(Aşağıda açılır)) | Kullanılabilir | 034796 |
Includes bibliographical references and index.
Dimensional Metrology Using Mode-Locked Lasers Seung-Woo Kim, Yoon-Soo Jang, Jiyong Park, Wooram Kim Nanopositioning and Nanomeasuring Machines Eberhard Manske Confocal Microscopy for Surface Profilometry Liang-Chia Chen Optical Sensors for Machine Tool Metrology Zhi-Feng Lou, Kuang-Chao Fan Optical Micro-CMM Yasuhiro Takaya, Masaki Michihata Machine Tool Calibration J. R. R. Mayer Accuracy and Performance Analysis of Machine Tools Andreas Archenti, Theodoros Laspas Machine Tool Prognosis for Precision Manufacturing Robert X. Gao, Peng Wang, Ruqiang Yan Cylindrical Gear Metrology Kang Ni, Yue Peng, Dirk Stöbener, Gert Goch High-Speed Measurement of Complex Shaped Parts by Laser Triangulation for In-Line Inspection Alexander Schöch, Enrico Savio Micro-dimensional Measurement by a Micro-probing System So Ito Measurements in Additive Manufacturing David Bue Pedersen, Sebastian Aagaard Andersen, Hans Nørgaard Hansen In-Line Measurement Technology and Quality Control Gisela Lanza, Benjamin Haefner, Leonard Schild, Dietrich Berger, Niclas Eschner, Raphael Wagner and others In-Process Measurement of Subwavelength Structures Satoru Takahashi Optical Scatterometry for Nanostructure Metrology Xiuguo Chen, Shiyuan Liu Contact-Type Micro Thermal Sensor for Surface Defect Detection Yuki Shimizu X-Ray Computed Tomography for Dimensional Metrology Filippo Zanini, Simone Carmignato Uncertainty Estimation in Computational Tools in Metrology Jean-Marc Linares Molecular Dynamics Characterization of a Force Sensor Integrated Fast Tool Servo for On-Machine Surface Metrology Yindi Cai
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