TY  - BOOK
AU  - Young,R.A.
ED  - Oxford University Press.
TI  - The Rietveld method
T2  - Monographs on crystallography
SN  - 0198559127
AV  - QD945 .R53 2002
PY  - 2002///
CY  - Oxford
PB  - Oxford University
KW  - Rietveld method
KW  - X-rays
KW  - Diffraction
KW  - Data processing
N1  - Includes bibliographical references and index; Introduction to the Rietveld Method; 1. The early days: a retrospective view; 2. Mathematical aspects of Rietveld refinement; 3. The flow of radiation in a polycrystalline material; 4. Data collection strategies: fitting the experiment to the need; 5. Background modelling in Rietveld analysis; 6. Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis; 7. Crystal imperfection broadening and peak shape in the Rietveld method; 8. Bragg reflection profile shape in X-ray powder diffraction patterns; 9. Restraints and constraints in Rietveld refinement; 10. Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources; 11. Combined X-ray and neutron Rietveld refinement; 12. Rietveld analysis programs Rietan and Premos and special applications; 13. Position - constrained and unconstrained powder-pattern-decomposition methods; 14. Ab initio structure solutions with powder diffraction data
N2  - "This book is distinctly not a 'proceedings' but it is a product of the same thrust that was responsible for the International Workshop on the Rietveld Method hosted by the Netherlands Energy Research Foundation ECN in Petten, The Netherlands, 13-15 June 1989. The workshop was organized by the IUCr Commission on Powder Diffraction (CPD) in co-operation with the ECN and was sponsored by the International Union of Crystallography (IUCr)." "Oxford science publications."
ER  -