TY  - BOOK
AU  - Lee,Jay
AU  - Wong,David W.S.
TI  - Statistical analysis with ArcView GIS
SN  - 0471348740
AV  - G70.212 .L43 2001
PY  - 2001///
CY  - New York
PB  - John Wiley & Sons
KW  - ArcView
KW  - Geographic information systems
KW  - Statistics
N1  - Includes bibliographical references and index; Attribute Descriptors --; Central Tendency --; Dispersion and Distribution --; Relationship --; Trend --; Point Descriptors --; The Nature of Point Features --; Central Tendency of Point Distributions --; Dispersion of Point Distributions --; Pattern Detectors --; Scale, Extent, and Projection --; Quadrat Analysis --; Nearest Neighbor Analysis --; Spatial Autocorrelation --; Line Descriptors --; The Nature of Linear Features --; Characteristics and Attributes of Linear Features --; Directional Statistics --; Network Analysis --; Pattern Descriptors --; Spatial Relationships --; Spatial Autocorrelation --; Spatial Weights Matrices --; Types of Spatial Autocorrelation Measures and Some Notations --; Joint Count Statistics --; Moran and Geary Indices --; General G-Statistic --; Local Spatial Autocorrelation Statistics --; Moran Scatterplot
UR  - http://www.loc.gov/catdir/bios/wiley043/00032090.html
UR  - http://www.loc.gov/catdir/description/wiley035/00032090.html
UR  - http://www.loc.gov/catdir/toc/onix06/00032090.html
ER  -