TY  - BOOK
AU  - Pecharsky,Vitalij K.
AU  - Zavalij,Peter Y.
TI  - Fundamentals of powder diffraction and structural characterization of materials
SN  - 1402073658 (acid-free paper)
AV  - QC482.D5 P43 2003
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic
KW  - X-rays
KW  - Diffraction
KW  - Measurement
KW  - Powders
KW  - Optical properties
KW  - X-ray crystallography
N1  - Includes bibliographical references and index; Contents; Preface; 1. Fundamentals of Crystalline State; 2. Fundamentals of Diffraction; 3. Experimental Techniques; 4. Preliminary Data Processing and Phase Analysis; 5. Unit Cell Determination and Refinement; 6. Crystal Structure Determination; 7. Crystal Structure Refinement; Index
ER  -