TY  - BOOK
AU  - Bowen,D.Keith
AU  - Tanner,B.K.
TI  - High resolution X-ray diffractometry and topography
SN  - 0850667585
AV  - QD945 .B683 1998
PY  - 1998///]
CY  - London, Bristol, PA
PB  - Taylor and Francis
KW  - X-ray crystallography
KW  - X-rays
KW  - Diffraction
KW  - Crystals
N1  - Includes bibliographical references and index
ER  -