TY  - BOOK
AU  - Will,Georg
TI  - Powder diffraction: the Rietveld method and the two-stage method to determine and refine crystal structures from powder diffraction data 
SN  - 3540279857
AV  - QD945 .W55 2006
PY  - 2006///]
CY  - Berlin, New York
PB  - Springer
KW  - Rietveld method
KW  - X-rays
KW  - Diffraction
N1  - Includes bibliographical references (pages [195]-202) and index; Contents; 1	General considerations	1; Introduction	1; Powder diffraction	9; 2	The Rietveld method	41; The Rietveld method	41; Special applications of the Rietveld method	64; 3	The two stage method	73; Introduction and background	73; Profile analysis and profile fitting	77; Examples of profile fitting in the two stage method	95; POWLS	99; Specimen and preferred orientation	107; R-values	112; Structure refinement by the two stage method	125; Analysis of quartz	136; Texture analysis with the two stage method using neutron diffraction	147; Selected examples for the application of the two stage method	160
ER  -