TY  - BOOK
AU  - Tsuji,Kouichi
AU  - Injuk,Jasna
AU  - Grieken,R.van
TI  - X-ray spectrometry: recent technological advances 
SN  - 047148640X
AV  - QD96.X2 X228 2005
PY  - 2004///]
CY  - Chichester, West Sussex, England, Hoboken, NJ, USA
PB  - Wiley
KW  - X-ray spectroscopy
KW  - Chemistry Techniques, Analytical
KW  - Spectrometry, X-Ray Emission
KW  - instrumentation
KW  - methods
N1  - Includes bibliographical references and index; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy; 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry; 4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy; 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy; 5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry; Index
ER  -