TY - BOOK AU - Chung,Frank H. AU - Smith,Deane K. TI - Industrial applications of X-ray diffraction SN - 0824719921 AV - TA417.25 .I52 2000 PY - 2000///] CY - New York PB - Marcel Dekker KW - Radiography, Industrial KW - X-rays KW - Diffraction N1 - Includes bibliographical references and index; Contents; Preface ; Contributors ; I Introduction ; 1 The Principles of Diffraction Analysis; /Frank H. Chung, Deane K. Smith; 2 The Practice of Diffraction Analysis; /Frank H. Chung, Deane K. Smith; 3 Progress and Potential of X-Ray Diffraction; /Frank H. Chung, Deane K. Smith; II Industrial Applications ; High-Tech ; 4 Semiconductors: Integrated Circuit Manufacture [and others]; /C. C. Goldsmith, I. C. Noyan, Patrick De Haven; 5 Superconductors: Structures and Applications; /Winnie Wong-Ng; 6 Aerospace: The Aircraft Gas Turbine Industry; /H. Jones; 7 Selected Applications of X-Ray Diffraction in the Automotive Industry; /C. K. Lowe-Ma, M. J. Vinarcik; 8 Petroleum Exploration and Production; /Sampath S. Iyengar; 9 Petroleum and Petrochemicals; /James A. Kaduk; 10 Petroleum Catalysts; /Ronald C. Medrud; 11 Petrochemicals: Vitality of Catalysts Research; /Ray Teller; Metals ; 12 Hydrometallurgy; /T. Havlik, M. Skrobian; 13 X-Ray Fractography; /Y. Hirose, T. Sasaki; Minerals and Ceramics ; 14 Mining: Exploration and Process Control; /Johan de Villiers; 15 Mining: Mineral Ores and Products; /Frank R. Feret; 16 Cement: Quantitative Phase Analysis of Portland Cement Clinker; /I. C. Madsen, N. V. Y. Scarlett; 17 Silica; /N. J. Elton, Deane K. Smith; 18 Glass-Ceramics; /Hans J. Holland; Polymers and Composites ; 19 Polymer Industry; /N. Sanjeeva Murthy, Randolph Barton, Jr; 20 Paint and Pigment Industry; /Frank H. Chung; 21 Pharmaceuticals: Development and Formulation; /Joel Bernstein, Jan-Olav Henck; 22 Pharmaceuticals: Design and Development of Drug Delivery Systems; /Jamshed Anwar; Chemicals ; 23 Energy: By-Products of Coal Combustion in Power Plants; /Gregory J. McCarthy; 24 Lighting: Design and Development of Luminescent Materials; /T. Justel, H. Nikol, C. Ronda; 25 Photography: Image Capture and Image Storage Materials; /T. N. Blanton; 26 Detergents and Cleaners: Phase Analysis of Sodium Phosphates; /T. F. Quail, J. K. M. Chun; 27 Museum: Art and Archaeology; /Michael Mantler, Manfred Schreiner, Francois Schweizer; 28 Forensic Science: Every Contact Leaves a Trace; /David F. Rendle; 29 U.S. Customs Laboratories; /Martin H. Liberman; 30 Commercial Service Laboratory; /W. N. Schreiner; III Specialty Techniques ; Radiation ; 31 Synchrotron Usage by Industry; /Richard Harlow; 32 Electron Microscopy in Industry; /Z. G. Li; Microstructures and Instrumentation ; 33 Line Profiles and Sample Microstructure; /J. Ian Langford; 34 Thin Films and Multilayers; /Paul F. Fewster; 35 Residual Stress and Stress Gradients; /Ivo Kraus, Nikolaj Ganev; 36 Residual Stress Development and Texture Formation During Rolling Contact Loading; /Aat P. Voskamp, Eric J. Mittemeijer; 37 Warren-Averbach Applications; /T. Ungar; 38 Microbeam Crystallographic and Elemental Analysis [and others]; /R. P. Goehner, M. O. Eatough, J. R. Michael; 39 High-Temperature and Nonambient X-Ray Diffraction; /Mark Rodriguez; Diffraction Patterns ; 40 NIST Standard Reference Materials for Characterization of Instrument Performance; /James P. Cline; 41 Grain Orientation and Texture; /Hans J. Bunge; 42 Structure Analysis from Powder Data; /D. Louer; Index ER -