TY  - BOOK
AU  - Kalpakjian,Serope
TI  - Manufacturing engineering and technology
SN  - 9789810681449
AV  - TS176 .K34 2010
PY  - 2010///]
CY  - Singapore
PB  - Prentice Hall
KW  - Production engineering
KW  - Manufacturing processes
N1  - Includes bibliographical references and index; Dimensional Metrology Using Mode-Locked Lasers; Seung-Woo Kim, Yoon-Soo Jang, Jiyong Park, Wooram Kim; Nanopositioning and Nanomeasuring Machines; Eberhard Manske; Confocal Microscopy for Surface Profilometry; Liang-Chia Chen; Optical Sensors for Machine Tool Metrology; Zhi-Feng Lou, Kuang-Chao Fan; Optical Micro-CMM; Yasuhiro Takaya, Masaki Michihata; Machine Tool Calibration; J. R. R. Mayer; Accuracy and Performance Analysis of Machine Tools; Andreas Archenti, Theodoros Laspas; Machine Tool Prognosis for Precision Manufacturing; Robert X. Gao, Peng Wang, Ruqiang Yan; Cylindrical Gear Metrology; Kang Ni, Yue Peng, Dirk Stöbener, Gert Goch; High-Speed Measurement of Complex Shaped Parts by Laser Triangulation for In-Line Inspection; Alexander Schöch, Enrico Savio; Micro-dimensional Measurement by a Micro-probing System; So Ito; Measurements in Additive Manufacturing; David Bue Pedersen, Sebastian Aagaard Andersen, Hans Nørgaard Hansen; In-Line Measurement Technology and Quality Control; Gisela Lanza, Benjamin Haefner, Leonard Schild, Dietrich Berger, Niclas Eschner, Raphael Wagner and others; In-Process Measurement of Subwavelength Structures; Satoru Takahashi; Optical Scatterometry for Nanostructure Metrology; Xiuguo Chen, Shiyuan Liu; Contact-Type Micro Thermal Sensor for Surface Defect Detection; Yuki Shimizu; X-Ray Computed Tomography for Dimensional Metrology; Filippo Zanini, Simone Carmignato; Uncertainty Estimation in Computational Tools in Metrology; Jean-Marc Linares; Molecular Dynamics Characterization of a Force Sensor Integrated Fast Tool Servo for On-Machine Surface Metrology; Yindi Cai
ER  -