TY  - BOOK
AU  - Waller,William F.
TI  - Electronic component testing
T2  - Electronic engineering series
SN  - 0333137914
AV  - TK7870 .E443 1972
PY  - 1972///
CY  - London
PB  - Macmillan
KW  - Electronic apparatus and appliances
KW  - Testing
KW  - Semiconductors
KW  - Integrated circuits
N1  - Includes bibliographical references
ER  -