Surface characterization methods : principles, techniques, and applications / edited by Andrew J. Milling

Includes bibliographical references and index

Contents Preface Contributors 1 Measurement of the Surface Tension and Surface Stress of Solids /Hans-Jurgen Butt, Roberto Raiteri 2 Contact Angle Techniques and Measurements /Daniel Y. Kwok, A. W. Neumann 3 Measurement of Ion-Mediated and van der Waals Forces Using Atomic Force Microscopy /Ian Larson, Andrew J. Milling 4 Measurement of Electro-osmosis as a Method for Electrokinetic Surface Analysis /Norman L. Burns 5 X-Ray Photoelectron Spectroscopy (XPS) and Static Secondary Ion Mass Spectrometry (SSIMS) of Biomedical Polymers and Surfactants /Kevin M. Shakesheff, Martyn C. Davies, Robert Langer 6 Evanescent Wave Scattering at Solid Surfaces /Adolfas K. Gaigalas 7 Characterizing Colloidal Materials Using Dynamic Light Scattering /Leo H. Hanus, Harry J. Ploehn 8 Light Scattering Studies of Microcapsules in Suspension /Toshiaki Dobashi, Benjamin Chu 9 Three-Dimensional Particle Tracking of Micronic Colloidal Particles /Y. Grasselli, Georges Bossis 10 Low-Mass Luminescent Organogels /Pierre Terech, Richard G. Weiss 11 Chromatographic Methods for Measurement of Antibody-Antigen Association Rates /Claire Vidal-Madjar, Alain Jaulmes 12 The Acid-Base Behavior of Proteins Determined by ISFETs /Wouter Olthuis, Piet Bergveld Index