X-ray spectrometry : recent technological advances / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken

Includes bibliographical references and index

Contributors. Preface. 1 Introduction. 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume. 2 X-Ray Sources. 2.1 Micro X-ray Sources. 2.2 New Synchrotron Radiation Sources. 2.3 Laser-driven X-ray Sources. 3 X-Ray Optics. 3.1 Multilayers for Soft and Hard X-rays. 3.2 Single Capillaries X-ray Optics. 3.3 Polycapillary X-ray Optics. 3.4 Parabolic Compound Refractive X-ray Lenses. 4 X-Ray Detectors. 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy. 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry. 4.3 Superconducting Tunnel Junctions. 4.4 Cryogenic Microcalorimeters. 4.5 Position Sensitive Semiconductor Strip Detectors. 5 Special Configurations. 5.1 Grazing-incidence X-ray Spectrometry. 5.2 Grazing-exit X-ray Spectrometry. 5.3 Portable Equipment for X-ray Fluorescence Analysis. 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis. 5.5 High-energy X-ray Fluorescence. 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy. 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy. 5.8 X-Ray Absorption Techniques. 6 New Computerisation Methods. 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy. 6.2 Spectrum Evaluation. 7 New Applications. 7.1 X-Ray Fluorescence Analysis in Medical Sciences. 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films. 7.3 X-Ray Spectrometry in Archaeometry. 7.4 X-Ray Spectrometry in Forensic Research. 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry. Index.