000			01617cam a2200337 i 4500
001			14660
005			20251219144840.0
008			020128s2003 enka 001 0 eng
020			_a0852969996
035			_a(OCoLC)
040			_aUKM _cUKM _dTXA _dOCLCQ _dUNA _dOSU _dBAUN _beng _erda
041	0		_aeng
049			_aBAUN_MERKEZ
050	0	4	_aTK7878.4 _b.K795 2003
082	0	4	_221
100	1		_aKularatna, N _eaut
245	1	0	_aDigital and analogue instrumentation : _btesting and measurement / _cNihal Kularatna
264		1	_aLondon : _bInstitution of Electrical Engineers, _c[2003]
264		4	_c©2003
300			_axxix, 645 pages : _billustrations ; _c25 cm
336			_aunspecified _bzzz _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
490	1		_aIEE electrical measurement series ; _v11
504			_aIncludes bibliographical references and index
505	0	0	_tIntroduction _t-- Enabling technologies _t-- Data converters _t-- Waveform parameters, multimeters and pulse techniques _t-- Fundamentals of oscilloscopes _t-- Recent developments on DSO techniques _t-- Electronic counters _t-- Conventional signal sources and arbitrary waveform generators _t-- Spectrum analysis _t-- Logic analysers _t-- An introduction to instrument buses and VLSI testing _t-- Transmission measurements _t-- Digital signal processors _t-- Sensors _t-- Calibration of instruments
650		0	_aElectronic instruments _xTesting _9100454
710	2		_9112133 _aInstitution of Electrical Engineers
830		0	_aIEE electrical measurement series ; _v11 _9110751
942			_2lcc _cKT
999			_c12538 _d12538