| 000 | 01418 am a2200313 i 4500 | ||
|---|---|---|---|
| 001 | 15035 | ||
| 005 | 20260105115323.0 | ||
| 008 | 030401s2003 maua b 001 0 eng | ||
| 020 | _a1402073658 (acid-free paper) | ||
| 040 |
_aDLC _cDLC _dC#P _dOHX _dUKM _dCIN _dBAUN _erda _beng |
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| 041 | 0 | _aeng | |
| 049 | _aBAUN_MERKEZ | ||
| 050 | 0 | 4 |
_aQC482.D5 _bP43 2003 |
| 100 | 1 |
_aPecharsky, Vitalij K. _992770 _eaut |
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| 245 | 1 | 0 |
_aFundamentals of powder diffraction and structural characterization of materials / _cby Vitalij K. Pecharsky, Peter Y. Zavalij. |
| 264 | 1 |
_aBoston: _bKluwer Academic, _c2003. |
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| 300 |
_axxiii, 713 pages : _billustrations ; _c24 cm. + _e1 CD-ROM (4 3/4 inches) |
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| 336 |
_2rdacontent _atext _btxt |
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| 337 |
_2rdamedia _aunmediated _bn |
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| 338 |
_2rdacarrier _avolume _bnc |
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| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | 0 |
_tContents _tPreface. _t1. Fundamentals of Crystalline State. _t2. Fundamentals of Diffraction. _t3. Experimental Techniques. _t4. Preliminary Data Processing and Phase Analysis. _t5. Unit Cell Determination and Refinement. _t6. Crystal Structure Determination. _t7. Crystal Structure Refinement. _tIndex. |
| 650 | 0 |
_aX-rays _xDiffraction _xMeasurement. _9115045 |
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| 650 | 0 |
_aPowders _xOptical properties _xMeasurement. |
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| 650 | 0 |
_aX-ray crystallography. _997805 |
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| 700 | 1 |
_aZavalij, Peter Y. _991166 _eaut |
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| 900 | _bsatın | ||
| 942 |
_2lcc _cKT |
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| 999 |
_c12836 _d12836 |
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