| 000 | 01056cam a2200325 i 4500 | ||
|---|---|---|---|
| 001 | 17269 | ||
| 005 | 20260304095811.0 | ||
| 008 | 980309s1998 enka b 001 0 eng d | ||
| 020 | _a0850667585 | ||
| 035 | _a(OCoLC) | ||
| 040 |
_aBAUN _beng _cBAUN _erda |
||
| 041 | 0 | _aeng | |
| 049 | _aBAUN_MERKEZ | ||
| 050 | 0 | 4 |
_aQD945 _b.B683 1998 |
| 100 | 1 |
_aBowen, D. Keith _q(David Keith), _d1940- _994352 _eaut |
|
| 245 | 1 | 0 |
_aHigh resolution X-ray diffractometry and topography / _cD. Keith Bowen and Brian K. Tanner. |
| 264 | 1 |
_aLondon ; _aBristol, PA : _bTaylor and Francis, _c[1998] |
|
| 264 | 4 | _c©1998 | |
| 300 |
_ax, 252 pages : _billustrations ; _c28 cm. |
||
| 336 |
_aunspecified _bzzz _2rdacontent |
||
| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_avolume _bnc _2rdacarrier |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aX-ray crystallography. _997805 |
|
| 650 | 0 |
_aX-rays _xDiffraction. _9115041 |
|
| 650 | 0 |
_aCrystals. _9100935 |
|
| 700 | 1 |
_aTanner, B. K. _q(Brian Keith) _eaut |
|
| 900 | _bsatın | ||
| 942 |
_2lcc _cKT |
||
| 999 |
_c14846 _d14846 |
||