000			01673nam a2200325 i 4500
008			050803s2006 gw a 000 0 eng d
010			_a 2005931757
020			_a3540279857 _qhbk.
024	3		_a9783540279860
035			_a(OCoLC)ocm62554168
040			_aOHX _cOHX _dBAKER _dUAT _dIXA _dDLC _dBAUN
049			_aBAUN_MERKEZ
050	0	4	_aQD945 _b.W55 2006
082	0	0	_222
100	1		_aWill, Georg.
245	1	0	_aPowder diffraction : _bthe Rietveld method and the two-stage method to determine and refine crystal structures from powder diffraction data / _cGeorg Will.
264		1	_aBerlin ; _aNew York : _bSpringer, _c[2006]
264		4	_c©2006
300			_aix, 224 pages : _billustrations ; _c25 cm.
336			_atext _btxt _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
504			_aIncludes bibliographical references (pages [195]-202) and index.
505	0	0	_tContents _t1 General considerations 1 _tIntroduction 1 _tPowder diffraction 9 _t2 The Rietveld method 41 _tThe Rietveld method 41 _tSpecial applications of the Rietveld method 64 _t3 The two stage method 73 _tIntroduction and background 73 _tProfile analysis and profile fitting 77 _tExamples of profile fitting in the two stage method 95 _tPOWLS 99 _tSpecimen and preferred orientation 107 _tR-values 112 _tStructure refinement by the two stage method 125 _tAnalysis of quartz 136 _tTexture analysis with the two stage method using neutron diffraction 147 _tSelected examples for the application of the two stage method 160
650		0	_aRietveld method.
650		0	_aX-rays _xDiffraction.
900			_a19549
900			_bSatın
942			_2lcc _cKT
999			_c16691 _d16691