000 01080nam a2200313 i 4500
008 920401s1992 mau b 001 0 eng
020 _a0750691689
040 _aBAUN
_beng
_cBAUN
049 _aBAUN_MERKEZ
050 0 4 _aTA418.7
_b.E539 1992
082 0 0 _220
100 1 _aBrundle, C. R
245 1 0 _aEncyclopedia of materials characterization :
_bsurfaces, interfaces, thin films /
_cC. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson
264 1 _aBoston :
_bButterworth-Heinemann ;
_c1992.
264 1 _aGreenwich, CT :
_bManning,
_c1992.
300 _axix, 751 pages :
_billustrations ;
_c24 cm
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
490 1 _aMaterials characterization series
504 _aIncludes bibliographical references and index
650 0 _aSurfaces (Technology)
_xTesting
700 1 0 _aEvans, Charles A
700 1 0 _aWilson, Shaun
830 0 _9110148
_aMaterials characterization series.
900 _a19574
900 _bSatın
942 _2lcc
_cKT
999 _c16730
_d16730