000 02884nam a2200349 i 4500
008 030724s2004 enka b 001 0 eng
010 _a2003057604
020 _a047148640X
_q(acid-free paper)
040 _aDNLM/DLC
_beng
_cDLC
_dNLM
_dC#P
_dCIN
_dBAUN
_erda
049 _aBAUN_MERKEZ
050 0 4 _aQD96.X2
_bX228 2005
082 0 0 _222
245 0 0 _aX-ray spectrometry :
_brecent technological advances /
_cedited by Kouichi Tsuji, Jasna Injuk, René Van Grieken
264 1 _aChichester, West Sussex, England ;
_aHoboken, NJ, USA :
_bWiley,
_c[2004]
264 4 _c©2004
300 _axii, 603 pages :
_billustrations ;
_c26 cm
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
504 _aIncludes bibliographical references and index
505 0 0 _tContributors.
_tPreface.
_t1 Introduction.
_t1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume.
_t2 X-Ray Sources.
_t2.1 Micro X-ray Sources.
_t2.2 New Synchrotron Radiation Sources.
_t2.3 Laser-driven X-ray Sources.
_t3 X-Ray Optics.
_t3.1 Multilayers for Soft and Hard X-rays.
_t3.2 Single Capillaries X-ray Optics.
_t3.3 Polycapillary X-ray Optics.
_t3.4 Parabolic Compound Refractive X-ray Lenses.
_t4 X-Ray Detectors.
_t4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy.
_t4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry.
_t4.3 Superconducting Tunnel Junctions.
_t4.4 Cryogenic Microcalorimeters.
_t4.5 Position Sensitive Semiconductor Strip Detectors.
_t5 Special Configurations.
_t5.1 Grazing-incidence X-ray Spectrometry.
_t5.2 Grazing-exit X-ray Spectrometry.
_t5.3 Portable Equipment for X-ray Fluorescence Analysis.
_t5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis.
_t5.5 High-energy X-ray Fluorescence.
_t5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy.
_t5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy.
_t5.8 X-Ray Absorption Techniques.
_t6 New Computerisation Methods.
_t6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy.
_t6.2 Spectrum Evaluation.
_t7 New Applications.
_t7.1 X-Ray Fluorescence Analysis in Medical Sciences.
_t7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films.
_t7.3 X-Ray Spectrometry in Archaeometry.
_t7.4 X-Ray Spectrometry in Forensic Research.
_t7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry.
_tIndex.
650 0 _aX-ray spectroscopy.
_997804
650 1 2 _aChemistry Techniques, Analytical
650 1 2 _aSpectrometry, X-Ray Emission
_xinstrumentation
650 1 2 _aSpectrometry, X-Ray Emission
_xmethods
700 1 _aTsuji, Kouichi
700 1 _aInjuk, Jasna
700 1 _aGrieken, R. van
_q(René)
900 _a19542
900 _bSatın
942 _2lcc
_cKT
999 _c16742
_d16742