000 01010cam a2200301 4500
008 121119s2007 gw m b a001 0 eng d
020 _a9783527613748
035 _a(OCoLC)
040 _cBAU
_aBAU
_btur
_erda
049 _aBAU_MERKEZ
050 0 4 _aE-KİTAP
245 0 0 _aX-ray characterization of materials :
_cEric Lifshin (ed.)
264 _aWeinheim ;
_aNew York :
_bWiley-VCH,
_cc1999.
300 _a1 online resource (261 pages) :
_billustrations
336 _2rdacontent
_atext
_btxt
337 _2rdamedia
_aunmediated
_bn
338 _2rdacarrier
_avolume
_bnc
500 _aElektronik kitap
504 _aIncludes bibliographical references and index.
650 0 _aMaterials
_xAnalysis.
650 0 _aX-rays
_xIndustrial applications.
650 0 _aX-ray spectroscopy
_997804
650 0 _aSurfaces (Technology)
_xAnalysis
_944419
700 1 _aLifshin, Eric
_995061
856 4 1 _3Tam metin
_uhttp://onlinelibrary.wiley.com/book/10.1002/9783527613748
900 _aEK272
942 _2lcc
_cEKT
999 _c30791
_d30791