| 000 | 02579nam a2200301 i 4500 | ||
|---|---|---|---|
| 008 | 130527s2010 sin 000 0 eng d | ||
| 020 | _a9789810681449 | ||
| 040 |
_aBAUN _beng _cBAUN _erda |
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| 049 | _aBAUN_MERKEZ | ||
| 050 | 0 | 4 |
_aTS176 _b.K34 2010 |
| 100 | 1 |
_aKalpakjian, Serope, _d1928- |
|
| 245 | 1 | 0 |
_aManufacturing engineering and technology / _cSerope Kalpakjian, Steven R. Schmid, Hamidon Musa. |
| 250 | _aSixth edition in sı units. | ||
| 264 | 1 |
_aSingapore : _bPrentice Hall, _c[2010] |
|
| 264 | 4 | _c©2010 | |
| 300 |
_axx, 1148 pages : _billustrations ; _c26 cm. |
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| 336 |
_2rdacontent _atext _btxt |
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| 337 |
_2rdamedia _aunmediated _bn |
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| 338 |
_2rdacarrier _avolume _bnc |
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| 380 | _aIndex | ||
| 380 | _aSurvey of literature | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | 0 |
_tDimensional Metrology Using Mode-Locked Lasers _rSeung-Woo Kim, Yoon-Soo Jang, Jiyong Park, Wooram Kim _tNanopositioning and Nanomeasuring Machines _rEberhard Manske _tConfocal Microscopy for Surface Profilometry _rLiang-Chia Chen _tOptical Sensors for Machine Tool Metrology _rZhi-Feng Lou, Kuang-Chao Fan _tOptical Micro-CMM _rYasuhiro Takaya, Masaki Michihata _tMachine Tool Calibration _rJ. R. R. Mayer _tAccuracy and Performance Analysis of Machine Tools _rAndreas Archenti, Theodoros Laspas _tMachine Tool Prognosis for Precision Manufacturing _rRobert X. Gao, Peng Wang, Ruqiang Yan _tCylindrical Gear Metrology _rKang Ni, Yue Peng, Dirk Stöbener, Gert Goch _tHigh-Speed Measurement of Complex Shaped Parts by Laser Triangulation for In-Line Inspection _rAlexander Schöch, Enrico Savio _tMicro-dimensional Measurement by a Micro-probing System _rSo Ito _tMeasurements in Additive Manufacturing _rDavid Bue Pedersen, Sebastian Aagaard Andersen, Hans Nørgaard Hansen _tIn-Line Measurement Technology and Quality Control _rGisela Lanza, Benjamin Haefner, Leonard Schild, Dietrich Berger, Niclas Eschner, Raphael Wagner and others _tIn-Process Measurement of Subwavelength Structures _rSatoru Takahashi _tOptical Scatterometry for Nanostructure Metrology _rXiuguo Chen, Shiyuan Liu _tContact-Type Micro Thermal Sensor for Surface Defect Detection _rYuki Shimizu _tX-Ray Computed Tomography for Dimensional Metrology _rFilippo Zanini, Simone Carmignato _tUncertainty Estimation in Computational Tools in Metrology _rJean-Marc Linares _tMolecular Dynamics Characterization of a Force Sensor Integrated Fast Tool Servo for On-Machine Surface Metrology _rYindi Cai |
| 650 | 0 | _aProduction engineering. | |
| 650 | 0 | _aManufacturing processes. | |
| 900 | _a34796 | ||
| 942 |
_2lcc _cKT |
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| 999 |
_c31974 _d31974 |
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