000 01132 am a2200337 i 4500
003 BAUN
008 940124s1993 enka b 001 0 eng d
010 _a 94172690
020 _a0852968655
035 _a(OCoLC)29674706
040 _aMiU
_cMiU
_dUk
_dIU
_dOCU
_dDLC
_dBAUN
_erda
_beng
049 _aBAUN_MERKEZ
050 0 4 _aQC611.8.G3
_bP76 1993
082 0 0 _220
245 0 0 _aProperties of lattice-matched and strained indium gallium arsenide /
_cedited by Pallab Bhattacharya.
264 1 _aLondon :
_bINSPEC, Institution of Electrical Engineers,
_c[1993]
264 4 _c©1993
300 _axxi, 317 pages :
_billustrations ;
_c29 cm.
336 _2rdacontent
_atext
_btxt
337 _2rdamedia
_aunmediated
_bn
338 _2rdacarrier
_avolume
_bnc
490 1 _aEMIS datareviews series ;
_vno.8
504 _aIncludes bibliographical references and index.
650 0 _aGallium arsenide semiconductors.
650 0 _aIndium alloys.
700 1 _aBhattacharya, Pallab.
710 2 _aINSPEC (Information service)
830 0 _9109568
_aEMIS datareviews series ;
_v8
900 _a5960
942 _2lcc
_cKT
999 _c4942
_d4942