000 02337 am a2200349 i 4500
001 8998
005 20250417173310.0
008 960105s1995 enka b 001 0 eng d
020 _a0852968248
040 _aCUY
_cCUY
041 0 _aeng
049 _aBAUN_MERKEZ
050 0 4 _aQC686
_b.T48 1995
245 0 0 _aIII-V quantum system research /
_cedited by K.H. Ploog
246 3 _aThree-five quantum system research
264 1 _aStevenage :
_bP. Peregrinus ;
_c[1995]
264 1 _aLondon :
_bon behalf of the Institution of Electrical Engineers,
_c[1995]
264 4 _c©1995
300 _axii, 357 pages :
_billustrations ;
_c24 cm
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
490 1 _aIEE materials and devices series ;
_v11
504 _aIncludes bibliographical references and index
505 0 0 _tContents
_tList of contributors
_tPreface
_t1 Fabrication of [actual symbol not reproducible] quantum wire and quantum dot structures by MOCVD and investigation of their structural and electronic properties
_r/ T. Fukui
_t2 In situ lateral patterning of GaAs surfaces: a new route to one- and zero-dimensional structures by molecular beam epitaxy
_r/ L. Daweritz, R. Notzel
_t3 InAs quantum sheets and quantum dots in GaAs
_r/ O. Brandt
_t4 Fabrication and electronic properties of antidot superlattices
_r/ K. Ensslin, R. Schuster
_t5 Fabrication and electronic properties of coupled quantum wires, dots and rings
_r/ K. Ismail
_t6 Focused ion beam direct writing of one-dimensional FETs
_r/ A. D. Wieck
_t7 High-resolution transmission electron microscopy of (AlGaIn)As quantum systems
_r/ M. Hohenstein, R. Bierwolf
_t8 X-ray diffraction studies of single and multiple quantum wells, heterointerfaces and quantum wires of III-V semiconductor compounds
_r/ L. Tapfer
_t9 Magneto-optics of (Al,Ga,In)As quantum systems
_r/ N. J. Pulsford
_t10 Fermi-edge singularity in (AlGaIn)As quantum systems
_r/ J. Wagner
_t11 Resonant tunnelling and electric field domain formation in GaAs-AlAs superlattices
_r/ H. T. Grahn
_tIndex
650 0 _aSemiconductors
_926724
650 0 _aQuantum electronics
700 1 _aPloog, Klaus
_9124270
_eaut
710 2 _9112133
_aInstitution of Electrical Engineers.
830 0 _9108768
_aIEE materials & devices series ;
_v11
942 _2lcc
_cKT
999 _c8273
_d8273