| 000 | 01026nam a2200301 i 4500 | ||
|---|---|---|---|
| 005 | 20250314104447.0 | ||
| 008 | 760515s1972 enka b 000 0 eng | ||
| 010 | _a75306992 | ||
| 020 |
_a0333137914 _q: |
||
| 040 |
_aDLC _beng _cDLC _dDLC _dBGZ _dBAUN _erda |
||
| 041 | 0 | _aeng | |
| 049 | _aBAUN_MERKEZ | ||
| 050 | 0 | 4 |
_aTK7870 _b.E443 1972 |
| 245 | 0 | 0 |
_aElectronic component testing / _cedited by W. F. Waller. |
| 250 | _aMacmillan engineering evaluations : student editions | ||
| 264 | 1 |
_aLondon : _bMacmillan, _c1972. |
|
| 300 |
_a[4], 91 pages : _billustrations ; _c30 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
||
| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_avolume _bnc _2rdacarrier |
||
| 490 | 0 | _aElectronic engineering series | |
| 504 | _aIncludes bibliographical references. | ||
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting _9123400 |
|
| 650 | 0 |
_aSemiconductors _xTesting _9123401 |
|
| 650 | 0 |
_aIntegrated circuits _xTesting _9123402 |
|
| 700 | 1 |
_aWaller, William F. _eedt _9123389 |
|
| 942 |
_2lcc _cKT |
||
| 999 |
_c95170 _d95170 |
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