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Lee, Jay.

Statistical analysis with ArcView GIS / Jay Lee, David W.S. Wong. - 202 pages: illustrations, maps ; 25 cm.

Includes bibliographical references and index.

Attribute Descriptors -- Central Tendency -- Dispersion and Distribution -- Relationship -- Trend -- Point Descriptors -- The Nature of Point Features -- Central Tendency of Point Distributions -- Dispersion of Point Distributions -- Pattern Detectors -- Scale, Extent, and Projection -- Quadrat Analysis -- Nearest Neighbor Analysis -- Spatial Autocorrelation -- Line Descriptors -- The Nature of Linear Features -- Characteristics and Attributes of Linear Features -- Directional Statistics -- Network Analysis -- Pattern Descriptors -- Spatial Relationships -- Spatial Autocorrelation -- Spatial Weights Matrices -- Types of Spatial Autocorrelation Measures and Some Notations -- Joint Count Statistics -- Moran and Geary Indices -- General G-Statistic -- Local Spatial Autocorrelation Statistics -- Moran Scatterplot

ISBN: 0471348740

Subjects--Uniform Titles:
ArcView.

Subjects--Topical Terms:
Geographic information systems.
Statistics.

LC Class. No.: G70.212 / .L43 2001

Dewey Class. No.: