Statistical analysis with ArcView GIS / Jay Lee, David W.S. Wong.
Dil: İngilizce Yayıncı: New York: John Wiley & Sons, 2001Tanım: 202 pages: illustrations, maps ; 25 cmİçerik türü:- text
- unmediated
- volume
- 0471348740
- 21
- G70.212 .L43 2001
| Materyal türü | Ana kütüphane | Koleksiyon | Yer numarası | Durum | İade tarihi | Barkod | Materyal Ayırtmaları | |
|---|---|---|---|---|---|---|---|---|
Kitap
|
Mehmet Akif Ersoy Merkez Kütüphanesi Genel Koleksiyon | Non-fiction | G70.212 .L43 2001 (Rafa gözat(Aşağıda açılır)) | Kullanılabilir | 014698 |
Includes bibliographical references and index.
Attribute Descriptors -- Central Tendency -- Dispersion and Distribution -- Relationship -- Trend -- Point Descriptors -- The Nature of Point Features -- Central Tendency of Point Distributions -- Dispersion of Point Distributions -- Pattern Detectors -- Scale, Extent, and Projection -- Quadrat Analysis -- Nearest Neighbor Analysis -- Spatial Autocorrelation -- Line Descriptors -- The Nature of Linear Features -- Characteristics and Attributes of Linear Features -- Directional Statistics -- Network Analysis -- Pattern Descriptors -- Spatial Relationships -- Spatial Autocorrelation -- Spatial Weights Matrices -- Types of Spatial Autocorrelation Measures and Some Notations -- Joint Count Statistics -- Moran and Geary Indices -- General G-Statistic -- Local Spatial Autocorrelation Statistics -- Moran Scatterplot
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