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Industrial applications of X-ray diffraction / edited by Frank H. Chung, Deane K. Smith - xiv, 1006 pages : illustrations ; 26 cm

Includes bibliographical references and index

Contents Preface Contributors I Introduction 1 The Principles of Diffraction Analysis 2 The Practice of Diffraction Analysis 3 Progress and Potential of X-Ray Diffraction II Industrial Applications High-Tech 4 Semiconductors: Integrated Circuit Manufacture [and others] 5 Superconductors: Structures and Applications 6 Aerospace: The Aircraft Gas Turbine Industry 7 Selected Applications of X-Ray Diffraction in the Automotive Industry 8 Petroleum Exploration and Production 9 Petroleum and Petrochemicals 10 Petroleum Catalysts 11 Petrochemicals: Vitality of Catalysts Research Metals 12 Hydrometallurgy 13 X-Ray Fractography Minerals and Ceramics 14 Mining: Exploration and Process Control 15 Mining: Mineral Ores and Products 16 Cement: Quantitative Phase Analysis of Portland Cement Clinker 17 Silica 18 Glass-Ceramics Polymers and Composites 19 Polymer Industry 20 Paint and Pigment Industry 21 Pharmaceuticals: Development and Formulation 22 Pharmaceuticals: Design and Development of Drug Delivery Systems Chemicals 23 Energy: By-Products of Coal Combustion in Power Plants 24 Lighting: Design and Development of Luminescent Materials 25 Photography: Image Capture and Image Storage Materials 26 Detergents and Cleaners: Phase Analysis of Sodium Phosphates 27 Museum: Art and Archaeology 28 Forensic Science: Every Contact Leaves a Trace 29 U.S. Customs Laboratories 30 Commercial Service Laboratory III Specialty Techniques Radiation 31 Synchrotron Usage by Industry 32 Electron Microscopy in Industry Microstructures and Instrumentation 33 Line Profiles and Sample Microstructure 34 Thin Films and Multilayers 35 Residual Stress and Stress Gradients 36 Residual Stress Development and Texture Formation During Rolling Contact Loading 37 Warren-Averbach Applications 38 Microbeam Crystallographic and Elemental Analysis [and others] 39 High-Temperature and Nonambient X-Ray Diffraction Diffraction Patterns 40 NIST Standard Reference Materials for Characterization of Instrument Performance 41 Grain Orientation and Texture 42 Structure Analysis from Powder Data Index /Frank H. Chung, Deane K. Smith /Frank H. Chung, Deane K. Smith /Frank H. Chung, Deane K. Smith /C. C. Goldsmith, I. C. Noyan, Patrick De Haven /Winnie Wong-Ng /H. Jones /C. K. Lowe-Ma, M. J. Vinarcik /Sampath S. Iyengar /James A. Kaduk /Ronald C. Medrud /Ray Teller /T. Havlik, M. Skrobian /Y. Hirose, T. Sasaki /Johan de Villiers /Frank R. Feret /I. C. Madsen, N. V. Y. Scarlett /N. J. Elton, Deane K. Smith /Hans J. Holland /N. Sanjeeva Murthy, Randolph Barton, Jr. /Frank H. Chung /Joel Bernstein, Jan-Olav Henck /Jamshed Anwar /Gregory J. McCarthy /T. Justel, H. Nikol, C. Ronda /T. N. Blanton /T. F. Quail, J. K. M. Chun /Michael Mantler, Manfred Schreiner, Francois Schweizer /David F. Rendle /Martin H. Liberman /W. N. Schreiner /Richard Harlow /Z. G. Li /J. Ian Langford /Paul F. Fewster /Ivo Kraus, Nikolaj Ganev /Aat P. Voskamp, Eric J. Mittemeijer /T. Ungar /R. P. Goehner, M. O. Eatough, J. R. Michael /Mark Rodriguez /James P. Cline /Hans J. Bunge /D. Louer

ISBN: 0824719921

LCCN: 99039511

Subjects--Topical Terms:
Radiography, Industrial
X-rays--Diffraction

LC Class. No.: TA417.25 / .I52 2000

Dewey Class. No.: