Balıkesir Üniversitesi
Kütüphane ve Dokümantasyon Daire Başkanlığı

Industrial applications of X-ray diffraction / (Kayıt no. 16756)

MARC ayrıntıları
000 -LEADER
fixed length control field 04336nam a2200313 i 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 991001s2000 nyua b 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 99039511
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0824719921
Qualifying information alk. paper
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Transcribing agency DLC
Modifying agency CIN
-- BAUN
049 ## - LOCAL HOLDINGS (OCLC)
Holding library BAUN_MERKEZ
050 04 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA417.25
Item number .I52 2000
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Edition number 21
245 00 - TITLE STATEMENT
Title Industrial applications of X-ray diffraction /
Statement of responsibility, etc edited by Frank H. Chung, Deane K. Smith
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture New York :
Name of producer, publisher, distributor, manufacturer Marcel Dekker,
Date of production, publication, distribution, manufacture, or copyright notice [2000]
Date of production, publication, distribution, manufacture, or copyright notice ©2000
300 ## - PHYSICAL DESCRIPTION
Extent xiv, 1006 pages :
Other physical details illustrations ;
Dimensions 26 cm
336 ## - CONTENT TYPE
Content Type Term text
Content Type Code txt
Source rdacontent
337 ## - MEDIA TYPE
Media Type Term unmediated
Media Type Code unmediated
Source rdamedia
338 ## - CARRIER TYPE
Carrier Type Term volume
Carrier Type Code volume
Source rdacarrier
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index
505 00 - FORMATTED CONTENTS NOTE
Title Contents
-- Preface
-- Contributors
-- I Introduction
-- 1 The Principles of Diffraction Analysis
Statement of responsibility /Frank H. Chung, Deane K. Smith
Title 2 The Practice of Diffraction Analysis
Statement of responsibility /Frank H. Chung, Deane K. Smith
Title 3 Progress and Potential of X-Ray Diffraction
Statement of responsibility /Frank H. Chung, Deane K. Smith
Title II Industrial Applications
-- High-Tech
-- 4 Semiconductors: Integrated Circuit Manufacture [and others]
Statement of responsibility /C. C. Goldsmith, I. C. Noyan, Patrick De Haven
Title 5 Superconductors: Structures and Applications
Statement of responsibility /Winnie Wong-Ng
Title 6 Aerospace: The Aircraft Gas Turbine Industry
Statement of responsibility /H. Jones
Title 7 Selected Applications of X-Ray Diffraction in the Automotive Industry
Statement of responsibility /C. K. Lowe-Ma, M. J. Vinarcik
Title 8 Petroleum Exploration and Production
Statement of responsibility /Sampath S. Iyengar
Title 9 Petroleum and Petrochemicals
Statement of responsibility /James A. Kaduk
Title 10 Petroleum Catalysts
Statement of responsibility /Ronald C. Medrud
Title 11 Petrochemicals: Vitality of Catalysts Research
Statement of responsibility /Ray Teller
Title Metals
-- 12 Hydrometallurgy
Statement of responsibility /T. Havlik, M. Skrobian
Title 13 X-Ray Fractography
Statement of responsibility /Y. Hirose, T. Sasaki
Title Minerals and Ceramics
-- 14 Mining: Exploration and Process Control
Statement of responsibility /Johan de Villiers
Title 15 Mining: Mineral Ores and Products
Statement of responsibility /Frank R. Feret
Title 16 Cement: Quantitative Phase Analysis of Portland Cement Clinker
Statement of responsibility /I. C. Madsen, N. V. Y. Scarlett
Title 17 Silica
Statement of responsibility /N. J. Elton, Deane K. Smith
Title 18 Glass-Ceramics
Statement of responsibility /Hans J. Holland
Title Polymers and Composites
-- 19 Polymer Industry
Statement of responsibility /N. Sanjeeva Murthy, Randolph Barton, Jr.
Title 20 Paint and Pigment Industry
Statement of responsibility /Frank H. Chung
Title 21 Pharmaceuticals: Development and Formulation
Statement of responsibility /Joel Bernstein, Jan-Olav Henck
Title 22 Pharmaceuticals: Design and Development of Drug Delivery Systems
Statement of responsibility /Jamshed Anwar
Title Chemicals
-- 23 Energy: By-Products of Coal Combustion in Power Plants
Statement of responsibility /Gregory J. McCarthy
Title 24 Lighting: Design and Development of Luminescent Materials
Statement of responsibility /T. Justel, H. Nikol, C. Ronda
Title 25 Photography: Image Capture and Image Storage Materials
Statement of responsibility /T. N. Blanton
Title 26 Detergents and Cleaners: Phase Analysis of Sodium Phosphates
Statement of responsibility /T. F. Quail, J. K. M. Chun
Title 27 Museum: Art and Archaeology
Statement of responsibility /Michael Mantler, Manfred Schreiner, Francois Schweizer
Title 28 Forensic Science: Every Contact Leaves a Trace
Statement of responsibility /David F. Rendle
Title 29 U.S. Customs Laboratories
Statement of responsibility /Martin H. Liberman
Title 30 Commercial Service Laboratory
Statement of responsibility /W. N. Schreiner
Title III Specialty Techniques
-- Radiation
-- 31 Synchrotron Usage by Industry
Statement of responsibility /Richard Harlow
Title 32 Electron Microscopy in Industry
Statement of responsibility /Z. G. Li
Title Microstructures and Instrumentation
-- 33 Line Profiles and Sample Microstructure
Statement of responsibility /J. Ian Langford
Title 34 Thin Films and Multilayers
Statement of responsibility /Paul F. Fewster
Title 35 Residual Stress and Stress Gradients
Statement of responsibility /Ivo Kraus, Nikolaj Ganev
Title 36 Residual Stress Development and Texture Formation During Rolling Contact Loading
Statement of responsibility /Aat P. Voskamp, Eric J. Mittemeijer
Title 37 Warren-Averbach Applications
Statement of responsibility /T. Ungar
Title 38 Microbeam Crystallographic and Elemental Analysis [and others]
Statement of responsibility /R. P. Goehner, M. O. Eatough, J. R. Michael
Title 39 High-Temperature and Nonambient X-Ray Diffraction
Statement of responsibility /Mark Rodriguez
Title Diffraction Patterns
-- 40 NIST Standard Reference Materials for Characterization of Instrument Performance
Statement of responsibility /James P. Cline
Title 41 Grain Orientation and Texture
Statement of responsibility /Hans J. Bunge
Title 42 Structure Analysis from Powder Data
Statement of responsibility /D. Louer
Title Index
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Radiography, Industrial
Topical term or geographic name as entry element X-rays
General subdivision Diffraction
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Chung, Frank H.,
Dates associated with a name 1930-
Personal name Smith, Deane K.
Fuller form of name (Deane Kingsley)
900 ## - EQUIVALENCE OR CROSS-REFERENCE-PERSONAL NAME [LOCAL, CANADA]
Personal Name 20018
Numeration Satın
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Koha item type Kitap
Mevcut
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Home library Current library Shelving location Date acquired Source of acquisition Cost, normal purchase price Inventory number Full call number Barcode Date last seen Price effective from Koha item type
    Library of Congress Classification     Non-fiction Mehmet Akif Ersoy Merkez Kütüphanesi Mehmet Akif Ersoy Merkez Kütüphanesi Genel Koleksiyon 27/11/2007 Satın Alma 339.49 255.07.02.01.06- TA417.25 .I52 2000 020018 22/12/2015 11/01/2015 Kitap
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